923665-28 ,SOIC/SOP Test Clip – 28-Pin Wide Body, Gold-Plated Contacts

The 923665-28 Test Clip is a professional-grade surface-mount IC test solution, specifically designed for 28-pin SOIC/SOP wide-body packages. Manufactured by 3M, a leader in high-quality electronic components, this clip provides a secure, non-invasive method for circuit debugging, programming, and signal monitoring. It is widely used by embedded system developers, engineers, and repair technicians for in-system testing and programming without requiring desoldering. Built with high-precision, gold-plated contacts, the 923665-28 ensures excellent conductivity and low contact resistance, making it ideal for reliable electrical connections. Its spring-loaded mechanism provides a firm grip on the IC leads, preventing accidental disconnections and ensuring stable signal transmission. The thermoplastic body enhances durability, offering resistance to heat and mechanical stress for long-term use in industrial and laboratory environments. This test clip features a 1.27mm pitch, conforming to standard SOIC/SOP package dimensions, making it highly compatible with a wide range of integrated circuits. The wide-body design allows engineers to interface effortlessly with SOIC/SOP chips, making it an essential tool for tasks such as firmware programming, real-time debugging, and circuit analysis.

Key Features:

• Designed for 28-Pin SOIC/SOP Packages – Wide-body test clip for reliable in-circuit testing.
• Gold-Plated Contacts – Ensures low contact resistance and high durability for stable signal transmission.
• Spring-Loaded Clip Mechanism – Provides a firm grip on IC leads, reducing signal loss.
• High-Quality Thermoplastic Body – Durable and resistant to heat, ensuring long-term performance.
• Non-Destructive Testing – Allows for IC programming, debugging, and monitoring without soldering.
• Universal Compatibility – Works with oscilloscopes, logic analyzers, IC programmers, and diagnostic tools.

Additional Specifications:

• Type: Test Clip